BS EN 14784-1-2005 无损检验.用存储荧光成像板的工业计算辐射摄影术.系统分类
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【英文标准名称】:Non-destructivetesting-Industrialcomputedradiographywithstoragephosphorimagingplates-Classificationofsystems
【原文标准名称】:无损检验.用存储荧光成像板的工业计算辐射摄影术.系统分类
【标准号】:BSEN14784-1-2005
【标准状态】:现行
【国别】:英国
【发布日期】:2005-09-30
【实施或试行日期】:2005-09-30
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:
【摘要】:ThisEuropeanStandardspecifiesfundamentalparametersofcomputedradiographysystemswiththeaimofenablingsatisfactoryandrepeatableresultstobeobtainedeconomically.Thetechniquesarebasedbothonfundamentaltheoryandtestmeasurements.Thisdocumentspecifiestheperformanceofcomputedradiography(CR)systemsandthemeasurementofthecorrespondingparametersforthesystemscannerandstoragephosphorimagingplate(IP).Itdescribestheclassificationofthesesystemsincombinationwithspecifiedmetalscreensforindustrialradiography.Itisintendedtoensurethatthequalityofimages-asfarasthisisinfluencedbythescanner-IPsystem-isinconformitywiththerequirementsofPart2ofthisdocument.ThedocumentrelatestotherequirementsoffilmradiographydefinedinEN584-1andISO11699-1.ThisEuropeanStandarddefinessystemtestsatdifferentlevels.Morecomplicatedtestsaredescribed,whichallowthedeterminationofexactsystemparameters.Theycanbeusedtoclassifythesystemsofdifferentsuppliersandmakethemcomparableforusers.Thesetestsarespecifiedasmanufacturertests.Someofthemrequirespecialtools,whichareusuallynotavailableinuserlaboratories.Therefore,simplerusertestsarealsodescribed,whicharedesignedforafasttestofthequalityofCRsystemsandlongtermstability.ThereareseveralfactorsaffectingthequalityofaCRimageincludinggeometricalun-sharpness,signal/noiseratio,scatterandcontrastsensitivity.Thereareseveraladditionalfactors(e.g.scanningparameters),whichaffecttheaccuratereadingofimagesonexposedIPsusinganopticalscanner.Thequalityfactorscanbedeterminedmostaccuratelybythemanufacturertestsasdescribedinthisdocument.Individualtesttargets,whicharerecommendedforpracticalusertests,aredescribedforqualityassurance.ThesetestscanbecarriedouteitherseparatelyorbytheuseoftheCRPhantom(AnnexB).ThisCRPhantomincorporatesmanyofthebasicqualityassessmentmethodsandthoseassociatedwiththecorrectfunctioningofaCRsystem,includingthescanner,forreadingexposedplatesandincorrectlyerasingIPsforfutureuseofeachplate.TheCRSystemclassesinthisdocumentdonotrefertoanyparticularmanufacturersImagingPlates.ACRsystemclassresultsfromtheuseofaparticularimagingplatetogetherwiththeexposureconditions-particularlytotalexposure-thescannertypeandthescanningparameters.
【中国标准分类号】:H26
【国际标准分类号】:19_100
【页数】:30P;A4
【正文语种】:英语
【原文标准名称】:无损检验.用存储荧光成像板的工业计算辐射摄影术.系统分类
【标准号】:BSEN14784-1-2005
【标准状态】:现行
【国别】:英国
【发布日期】:2005-09-30
【实施或试行日期】:2005-09-30
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:
【摘要】:ThisEuropeanStandardspecifiesfundamentalparametersofcomputedradiographysystemswiththeaimofenablingsatisfactoryandrepeatableresultstobeobtainedeconomically.Thetechniquesarebasedbothonfundamentaltheoryandtestmeasurements.Thisdocumentspecifiestheperformanceofcomputedradiography(CR)systemsandthemeasurementofthecorrespondingparametersforthesystemscannerandstoragephosphorimagingplate(IP).Itdescribestheclassificationofthesesystemsincombinationwithspecifiedmetalscreensforindustrialradiography.Itisintendedtoensurethatthequalityofimages-asfarasthisisinfluencedbythescanner-IPsystem-isinconformitywiththerequirementsofPart2ofthisdocument.ThedocumentrelatestotherequirementsoffilmradiographydefinedinEN584-1andISO11699-1.ThisEuropeanStandarddefinessystemtestsatdifferentlevels.Morecomplicatedtestsaredescribed,whichallowthedeterminationofexactsystemparameters.Theycanbeusedtoclassifythesystemsofdifferentsuppliersandmakethemcomparableforusers.Thesetestsarespecifiedasmanufacturertests.Someofthemrequirespecialtools,whichareusuallynotavailableinuserlaboratories.Therefore,simplerusertestsarealsodescribed,whicharedesignedforafasttestofthequalityofCRsystemsandlongtermstability.ThereareseveralfactorsaffectingthequalityofaCRimageincludinggeometricalun-sharpness,signal/noiseratio,scatterandcontrastsensitivity.Thereareseveraladditionalfactors(e.g.scanningparameters),whichaffecttheaccuratereadingofimagesonexposedIPsusinganopticalscanner.Thequalityfactorscanbedeterminedmostaccuratelybythemanufacturertestsasdescribedinthisdocument.Individualtesttargets,whicharerecommendedforpracticalusertests,aredescribedforqualityassurance.ThesetestscanbecarriedouteitherseparatelyorbytheuseoftheCRPhantom(AnnexB).ThisCRPhantomincorporatesmanyofthebasicqualityassessmentmethodsandthoseassociatedwiththecorrectfunctioningofaCRsystem,includingthescanner,forreadingexposedplatesandincorrectlyerasingIPsforfutureuseofeachplate.TheCRSystemclassesinthisdocumentdonotrefertoanyparticularmanufacturersImagingPlates.ACRsystemclassresultsfromtheuseofaparticularimagingplatetogetherwiththeexposureconditions-particularlytotalexposure-thescannertypeandthescanningparameters.
【中国标准分类号】:H26
【国际标准分类号】:19_100
【页数】:30P;A4
【正文语种】:英语
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